Semiconductor inspection process - Cleaning sheet for probe cards
Cleaning sheets for probe cards in the semiconductor wafer inspection process!
For semiconductor wafer inspection processes! Cleaning sheets for probe cards ■□■Features■□■ ■Allows for low-wear cleaning ■Compatible with various types of probe tips, including cantilever, vertical type, MEMS type, and other card types ■Includes types suitable for high-temperature use ■Can be attached to wafers and polishing plates ■□■Product Lineup■□■ ■For needle tip polishing: PET TYPE ■For low-damage needle tip polishing: PF3 TYPE ■For low-damage needle tip polishing: SWE TYPE ■For damage-free cleaning: ASE TYPE ■For low-damage needle tip polishing: BC3 TYPE ■For more details, please contact us.
- Company：Mipox
- Price：Other
